Spectrum analyzer control in an oscilloscope
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United States of America Patent
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Issued Date -
Feb 1, 2007
app pub date -
Jul 26, 2005
filing date -
Jul 26, 2005
priority date (Note) -
Abandoned
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Abstract
A time domain measurement instrument and method are provided. The instrument comprises an acquisition circuit for acquiring a signal in a time domain and a processor for performing a Fast Fourier Transform (FFT) processing on the acquired signal to generate an FFT of the acquired signal. A frequency domain analysis tool is also provided for analyzing and manipulating the FFT, wherein the frequency domain analysis tool instructs the processor to automatically determine the frequency of a peak amplitude of the FFT, and to determine the amplitude at the determined peak frequency.
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