Probe use in electric test
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United States of America Patent
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N/A
Issued Date -
Jan 25, 2007
app pub date -
May 19, 2006
filing date -
May 31, 2005
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A probe comprises a body member having a front end area and supported on a support member in a cantilever state, and a tip member combined with the front end area of the body member. The tip member includes a base portion with at least a part of the tip member embedded in the front end area; a contact portion to be pressed against a device under test and projecting from the base portion in a second direction; and a reference portion formed at a position spaced apart from the contact portion in a first direction and projecting from the base portion in the second direction intersecting the first direction, and is made of a harder material than the body member.
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