Silicon film forming apparatus

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United States of America Patent

SERIAL NO

11519132

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Abstract

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A silicon film forming apparatus includes a deposition chamber (10), a silicon sputter target (2) arranged in the chamber, a hydrogen gas supply circuit (102 or 102') supplying a hydrogen gas into the chamber, and a high-frequency power applying device (antenna 1, 1', power source PW and others) generating inductively coupled plasma by applying high-frequency power to the gas supplied into the deposition chamber (10). Chemical sputtering is effected on the target (2) by the plasma to form a silicon film on a substrate S. A silane gas may be used. A silane gas supply circuit (101) may be provided with a gas reservoir unit (GR). The silicon film can be formed inexpensively and fast at a relatively low temperature.

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Patent Owner(s)

Patent OwnerAddress
NISSIN ELECTRIC CO LTDKYOTO-SHI KYOTO 615
EMD CORPORATIONSHIGA 520-2323

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujiwara, Masaki Kyoto-shi, JP 187 4154
Kotera, Takashi Kyoto-shi, JP 4 17
Onoda, Masatoshi Kyoto-shi, JP 15 41
Takahashi, Eiji Kyoto-shi, JP 267 2627
Tomyo, Atsushi Kyoto-shi, JP 15 73

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