High resolution time interval measurement apparatus and method

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United States of America Patent

PATENT NO 7330803
APP PUB NO 20070005288A1
SERIAL NO

11158442

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Abstract

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A time interval measurement apparatus and method counts the total number of full clock time periods between two measurement signals. Clock fractional time periods are generated between each of the two measurement signals and the next leading edge of a full clock time period. The total number of full clock time periods and the clock fractional time periods are converted to a time equivalent measurement and combined to generate the total time interval between the two measurement signals.

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Patent Owner(s)

Patent OwnerAddress
AMETEK INC627 LAKE STREET KENT OH 44240

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Pattee, Jack Davisberg, MI 4 18
Zhukov, Mikhail S Rochester Hills, MI 1 1

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