Method and apparatus for forming a crystalline silicon thin film

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United States of America Patent

SERIAL NO

11519128

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Abstract

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A hydrogen gas is supplied into a deposition chamber (10) accommodating a silicon sputter target (2) and a deposition target substrate (S), a high-frequency power is applied to the gas to generate plasma exhibiting H.alpha./SiH* from 0.3 to 1.3 in the deposition chamber, and chemical sputtering is effected on the silicon sputter target (2) by the plasma to form a crystalline silicon thin film on the substrate (2). A crystalline silicon thin film of a good quality can be formed inexpensively and safely at a relatively low temperature.

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Patent Owner(s)

Patent OwnerAddress
NISSIN ELECTRIC CO LTDKYOTO-SHI KYOTO 615
EMD CORPORATIONSHIGA 520-2323

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Takahashi, Eiji Kyoto-shi, JP 267 2627
Tomyo, Atsushi Kyoto-shi, JP 15 73

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