Ultrasonically coupled scanning probe microscope
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United States of America Patent
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Issued Date -
Dec 28, 2006
app pub date -
Mar 17, 2006
filing date -
Mar 18, 2005
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
Scanning probe microscopes include a probe tip coupled to a tuning fork or other acoustic resonator so as to apply a shear force when contacted to a specimen surface based on an applied acoustic signal. A secondary ultrasonic transducer is in acoustic communication with the specimen. The probe tip and the secondary ultrasonic transducer are acoustically coupled when the probe tip is in proximity to a specimen surface. Changes in resonance frequency, admittance, or other characteristic of acoustic signals coupled to the probe tip or a secondary ultrasonic transducer secured to either the specimen or the probe tip can be used in specimen imaging or to estimate probe tip placement respect to a specimen surface.
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