Increased detectability and range for x-ray backscatter imaging systems
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United States of America Patent
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Issued Date -
Nov 2, 2006
app pub date -
Mar 21, 2006
filing date -
Mar 21, 2005
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Abandoned
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Abstract
An inspection system based on penetrating radiation provides an option to significantly narrow the field of view of a scan. First and second primary limiting apertures are provided for interposition between a source of penetrating radiation and an inspected object. This allows for significantly increasing the flux of penetrating radiation on this narrowed region of interest, thereby advantageously improving detectability. Alternatively or in addition, an operator can use the higher flux to increase the distance from which an object can be imaged. Embodiments include both scatter and transmission systems that employ a pencil beam.
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