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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
HERAEUS ELECTRO-NITE INTERNATIONAL N V	3530 HOUTHALEN

International Classification(s)

• G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....

• 2006 Application Filing Year
• G01N Class
• 5583 Applications Filed
• 3036 Patents Issued To-Date
• 54.38 % Issued To-Date

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Gerits, Erik	Genk, BE	5	6
# of filed Patents : 5 Total Citations : 6

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• 0 Citation Count
• G01N Class

• 0 % this patent is cited more than
• 19 Age

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

Full Text

US Patent Application No: 2006/0237,311

IMMERSION MEASURING PROBE

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Abstract

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An immersion measuring probe, particularly a drop-in measuring probe for molten metal, is provided having a measuring head, on which at least one sensor carrier having at least one sensor is arranged. The sensor carrier is held at or in an opening in the measuring head. At or near the opening in the measuring head, a combustible and/or a gas-containing or gas-generating porous material is arranged.

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Description

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