Method for determining at least one state parameter of a sealing system and sealing system
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United States of America Patent
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Issued Date -
Oct 5, 2006
app pub date -
Feb 5, 2004
filing date -
Feb 7, 2003
priority date (Note) -
Abandoned
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Abstract
The invention relates to a method for determining at least one state parameter of a sealing system (10, 110) comprising at least one sealing element (12, 112) and at least one dielectric element (24, 124) containing dielectric material (26, 126). The invention is characterised in that the real part and/or the imaginary part of the complex, dielectric function of the dielectric element is measured.
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