Method of forming copper wiring layer

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United States of America Patent

APP PUB NO 20060178007A1
SERIAL NO

11344014

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Abstract

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A method of forming a copper wiring layer, which includes forming a pattern of copper seed layer on a substrate, and forming a copper wiring pattern on the pattern of copper seed layer by means of electroless plating. At least one component of semiconductor device selected from the group consisting of the gate electrode, the source electrode, the drain electrode, and a wiring connected with at least one of these electrodes is formed by a method comprising forming a pattern of copper seed layer, and forming a copper wiring pattern on the pattern of copper seed layer by means of electroless plating.

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Patent Owner(s)

Patent OwnerAddress
TOSHIBA MOBILE DISPLAY CO LTD1-9-2 HATARA-CHO FUKAYA-SHI SAITAMA 366-0032

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aomori, Shigeru Kashiwa-shi, JP 46 458
Kado, Masaki Saitama-shi, JP 38 130
Nakamura, Hiroki Ageo-shi, JP 382 4527

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