Vertical probe card, probes for vertical probe card and method of making the same
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United States of America Patent
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N/A
Issued Date -
Aug 3, 2006
app pub date -
Jan 5, 2006
filing date -
Feb 2, 2005
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A vertical probe card includes a circuit board and a probe set having a base and a plurality of probes provided at the base and electrically connected to the circuit board. Each probe has a foot, a tip and a middle body portion connected between the foot and the tip. The middle body portion has a coefficient of elasticity smaller than that of the base or the foot so that the middle body portion is forced to deform relative to the base when the tip touched a device under test.
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