Multiparametric detection in a fluidic microsystem
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United States of America Patent
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Issued Date -
Jul 13, 2006
app pub date -
Feb 4, 2004
filing date -
Feb 5, 2003
priority date (Note) -
Abandoned
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Abstract
Disclosed is a method for measuring properties of particles that move through a fluidic microsystem, the particles being suspended in a liquid. According to the inventive method, a first parameter of a specific particle is first measured at a first test station (11). A second parameter of the particle is then measured at an interval from the first measurement at a second test station (12) which is spatially separated from the first test station (11), and the first and second parameters are jointly evaluated in a correlated manner, the first and second parameters being characteristic of different properties of the tested particle. The evaluation comprises a comparison of the first and second parameters with predetermined expected values. Another measurement is taken or manipulations are performed on the tested particle according to the result of the comparison. Also disclosed is a fluidic microsystem that is designed for implementing the inventive method.
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