Design failure mode effect analysis (DFMEA)
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United States of America Patent
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app pub date -
Dec 5, 2005
filing date -
Dec 26, 2001
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Abandoned
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Abstract
A Design Failure Mode Effect Analysis (DFMEA) method analyzes faults and failures in the design phase of electronic devices. A data-entry mask is used for recording some information concerning the performed analysis and a portion of the recording form is displayed to a user in an electronic display format. The method detects and records past design problems and their corresponding solutions, by a DFMEA method using the data-entry mask form; associates keywords in a database with each problem; associates data concerning each of the design problems, in the same database, including information concerning past fails occurred in similar applications; detects major changes and/or innovations, as well as any improved block or part of a new device with respect to other devices, thereby postulating possible new problems introduced by the new device; and records the new problems and their possible solutions, by the DFMEA method and using the form.
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