Sample inspection apparatus for combining nmr with esr or icr-mass spectroscopy
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United States of America Patent
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Issued Date -
Jun 15, 2006
app pub date -
Nov 18, 2003
filing date -
Nov 19, 2002
priority date (Note) -
Abandoned
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Abstract
Sample inspection apparatus comprises a pair of magnet assemblies (28A, 28B) located in a common cryostat (10) and surrounding respective bores (24, 26) at room temperature so as to define corresponding working regions (30, 32) in the bore. A first, NMR probe (6) can be inserted in one of the bores to bring a sample into the corresponding working region, the magnetic field in that working region having a homogeneity or profile suitable for performing a NMR experiment. A second probe (5) can be inserted in the other of the bores to bring a sample into the other working region, the magnetic field in that working region having a homogeneity or profile suitable for performing a different experiment on the sample.
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