Method for calibrating a probe
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United States of America Patent
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Jul 24, 2007
Grant Date -
Jun 8, 2006
app pub date -
Nov 25, 2005
filing date -
May 28, 2003
priority date (Note) -
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Abstract
A method measures values on a workpiece (7) using a coordinate measuring apparatus which has a measuring probe head (5) with a deflectable probe pin (6). The coordinate measuring apparatus can carry out a linear or nonlinear projection (transformation) of the deflection signals (s) determined by the measuring probe head (5) into a coordinate system (X.sub.M, Y.sub.M, Z.sub.M) of the coordinate measuring apparatus using parameters (A). In order to be able to use the method for any measuring probe, more particularly probes whose probe pins are not moveably guided in the directions of the coordinates, at least a portion of the parameters (A.sub.anti) describes components of the deflection of the probe pin which are located tangentially relative to the surface of the workpiece on the touch point.
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