Method and apparatus for model extraction
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United States of America Patent
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Issued Date -
Jun 1, 2006
app pub date -
Nov 30, 2004
filing date -
Nov 30, 2004
priority date (Note) -
Abandoned
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Abstract
A method and apparatus for extracting a model of a device under test (DUT), wherein an extraction-space protocol is defined, a set of measurement data on the DUT is extracted in accordance with the extraction-space protocol, and a DUT model extracted from the set of measurement data collected over the extraction-space, corresponding to a combination of parameters within the extraction-space.
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