Analytical measurement meters with location determination capability
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United States of America Patent
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Issued Date -
May 18, 2006
app pub date -
Nov 17, 2005
filing date -
Nov 18, 2004
priority date (Note) -
Abandoned
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Abstract
An instrument and a method for making measurements that are coupled with the location at which a measurement is made. There is provided an instrument that is capable of making an analytical measurement, the instrument having an instrument locator capability. When the analytical measurement is made, the location is associated with the measurement and stored in memory.
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