Method and apparatus for automatically generating test data for code testing purposes
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United States of America Patent
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Issued Date -
Mar 23, 2006
app pub date -
Sep 7, 2004
filing date -
Sep 7, 2004
priority date (Note) -
Abandoned
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Abstract
One embodiment of the present invention provides a system that automatically generates test data for code testing purposes. During operation, the system receives code under test (CUT). The system then determines type information for one or more parameters for methods of the CUT. Next, the system automatically selects, based on the type information, one or more test data factories (TDFs) to generate test data for parameters of the CUT.
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