Barrier metal film production apparatus, barrier metal film production method, metal film production method, and metal film production apparatus

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United States of America Patent

SERIAL NO

11252811

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Abstract

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A Cl.sub.2 gas plasma is generated at a site within a chamber between a substrate and a metal member. The metal member is etched with the Cl.sub.2 gas plasma to form a precursor. A nitrogen gas is excited in a manner isolated from the chamber accommodating the substrate. A metal nitride is formed upon reaction between excited nitrogen and the precursor, and formed as a film on the substrate. After film formation of the metal nitride, a metal component of the precursor is formed as a film on the metal nitride on the substrate. In this manner, a barrier metal film with excellent burial properties and a very small thickness is produced at a high speed, with diffusion of metal being suppressed and adhesion to the metal being improved.

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Patent Owner(s)

Patent OwnerAddress
PHYZCHEMIX CORPORATIONATT EAST 11F 17-22 AKASAKA 2-CHOME MINATO-KU TOKYO 107-0052

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Matsuda, Ryuichi Takasago-shi, JP 38 170
Nishimori, Toshihiko Takasago-shi, JP 28 201
Ooba, Yoshiyuki Yokohama-shi, JP 19 77
Sakamoto, Hitoshi Yokohama-shi, JP 170 1468
Yahata, Naoki Takasago-shi, JP 33 174

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