Multilayer microstructural device
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United States of America Patent
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Issued Date -
Mar 9, 2006
app pub date -
Jun 27, 2003
filing date -
Jul 4, 2002
priority date (Note) -
Abandoned
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Abstract
Multilayer microstructural device comprising a first and a second layer, which layers are aligned relative to each other by mating alignment structures. The first layer is a positive replication of a microstructural master comprising a number of microstructural elements, the second layer is a negative replication of the same microstructural master, and each pair of mating alignment structures originate from the same microstructural element on the master.
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