System and method for 3D measurement and surface reconstruction
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United States of America Patent
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Issued Date -
Jan 26, 2006
app pub date -
Jul 15, 2004
filing date -
Jul 15, 2004
priority date (Note) -
Abandoned
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Abstract
A system and method for measuring and surface reconstruction of a 3D image of an object comprises a projector arranged to project a pattern onto a surface of an object to be imaged; and a processor stage arranged to examine distortion or distortions produced in the pattern by the surface. The processor stage is arranged to convert by, for example, a triangulation process the distortion or distortions produced in the pattern by the surface to a distance representation representative of the shape of the surface. The processor stage is also arranged to reconstruct electronically the surface shape of the object.
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