Method of inspecting workpieces on a measuring machine
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United States of America Patent
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Issued Date -
Dec 29, 2005
app pub date -
May 10, 2005
filing date -
May 10, 2004
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A method of inspecting a series of workpieces including a calibration step in which calibration data are obtained by measuring a reference workpiece in a high accuracy measuring device in laboratory conditions, a mastering step in which mastering data are obtained by measuring the reference workpiece on a measuring machine in production conditions, a workpiece inspection step whereby workpiece inspection data are obtained by measuring another workpiece from said series of workpieces on the measuring machine in the production conditions, and a compensation step in which measurement results obtained in the workpiece inspection step are corrected by using the calibration data and the mastering data.
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