Strain gauge apparatus having a point-distributed sensor
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United States of America Patent
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Issued Date -
Dec 22, 2005
app pub date -
Jun 16, 2004
filing date -
Jun 16, 2004
priority date (Note) -
Abandoned
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Abstract
A strain gauge apparatus having a point-distributed sensor for measuring the strain of a mechanical structure. The strain gauge comprises a thin elongated piezoresistive lamina with a shape contour that is symmetric with respect to the longitudinal axis thereof, and the width of the lamina at the center along the longitudinal axis is minimum for the entire lamina length. The point-distributed strain gauge apparatus measures both static and dynamic deformation in the measured structure at a precise location aligned to the targeted center of the sensor lamina.
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