Test device for electrical testing of a unit under test, as well as a method for production of a test drive
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United States of America Patent
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Issued Date -
Dec 1, 2005
app pub date -
Apr 8, 2005
filing date -
May 28, 2004
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The invention relates to a test device for electrical testing of a unit under test, in particular for the testing of wafers, having a contact head which can be associated with the unit under test and is provided with contact elements which are in the form of pins and form a contact pin arrangement, and having an electrical connecting apparatus, which has contact surfaces which make a touching contact with those ends of the contact elements which face away from the test plane accommodating the unit under test. The invention provides that the contact surfaces are on axial contact elements which extend in the axial direction and are in the form of mechanically processed contact surfaces.
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