Method for measuring a spectrum of a sample by means of an infrared spectrometer and infrared spectrometer of this type
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United States of America Patent
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Issued Date -
Nov 24, 2005
app pub date -
May 16, 2005
filing date -
May 19, 2004
priority date (Note) -
Abandoned
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Abstract
A method for measuring a spectrum of a sample by means of an infrared spectrometer is described, the spectrometer comprising at least one component whose operating behavior is influenced by at least one operating parameter which, in the event of a change, changes the operating behavior of the at least one component and thereby influences the spectrum to be measured, the method comprising detecting the at least one operating parameter at least once during the measurement of the spectrum, reckoning back the operating behavior of the at least one component in a manner dependent on the detected operating parameter to a predetermined reference value of the operating parameter, and further conducting at least one of the following steps: measuring the spectrum on the basis of the predetermined reference value of the operating parameter, correcting the spectrum on the basis of the predetermined reference value of the operating parameter.
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