Enterprise test data management system utilizing automatically created test data structures and related methods

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United States of America Patent

SERIAL NO

11112171

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Abstract

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Test data model and test data structure creation improvements are disclosed for enterprise test data management systems in the test, measurement and automation environment. In part, an enterprise test data management system is disclosed that utilizes a test data structure creation tool configured to operate on one or more server systems to automatically generate test data structures for the database. In addition, the test data management system can utilize a run-time tool that is configured to analyze test data received from a test system, to determine if fields for the data exist in the database, and if not, to automatically generate the fields for the data in the database. The test data management system can also utilize a data import tool that is configured to analyze historical test data files, to map data within the historical data files to fields within the database, and to automatically generate new fields for the data in the database. Related systems and methods are also disclosed.

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Patent Owner(s)

Patent OwnerAddress
VI TECHNOLOGY INC3700 W PARMER LANE SUITE 200 AUSTIN TX 78727

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Gamez, Cesar R Pflugerville, TX 5 263
House, Richard W Austin, TX 5 263
Neil, Chris Cedar Park, TX 2 86
Venkatraman, Chandrasekhar Hyderabad, IN 4 125

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