Circuit and method for low frequency testing of high frequency signal waveforms
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United States of America Patent
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Issued Date -
Oct 13, 2005
app pub date -
Jul 21, 2004
filing date -
Jul 25, 2003
priority date (Note) -
Abandoned
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Abstract
A method of deducing properties of the shape of a waveform comprises (a) generating a signal based on a periodic pattern of logic levels; (b) measuring a DC level that is proportional to the average level of the signal and a DC level that is proportional to the average of the signal level squared; (c) repeating steps (a) and (b) one or more times; and (d) calculating a property value of the shape of the waveform based on a plurality of measurements.
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