Method for measuring the location of an object by phase detection
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United States of America Patent
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Issued Date -
Oct 13, 2005
app pub date -
Mar 24, 2005
filing date -
Feb 28, 2002
priority date (Note) -
Abandoned
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Abstract
A method for measuring the location of an object in an observed space by means of a fixed observation system connected to a processing unit for generation of an image comprising a pixel matrix, the object being provided with a test marker. The test marker comprises a periodic pattern in two dimensions and a digital processing of the image of the test marker is carried out to produce an image comprising a first grating and an image comprising a second grating which are analyzed digitally to calculate the position of the test marker within the matrix of pixels.
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