Scan test tools, models and/or methods
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United States of America Patent
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Issued Date -
Sep 22, 2005
app pub date -
Mar 22, 2004
filing date -
Mar 22, 2004
priority date (Note) -
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Abstract
Tools, systems and/or methods for use in a test process of a circuit device. Such tools, systems and/or methods may provide for identifying respective parent and branch portions of a scan chain of a circuit device, the scan chain having at least one scan input and one or more scan outputs and a plurality of scan cells; and creating a model of the scan chain, including creating a dummy cell chain which includes a branch portion of the scan chain and has one or more dummy cells disposed therein connected between the branch portion and the scan input.
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