Turbidity sensing system with reduced temperature effects
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United States of America Patent
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Issued Date -
Sep 1, 2005
app pub date -
Feb 23, 2005
filing date -
Feb 26, 2004
priority date (Note) -
Abandoned
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Abstract
A turbidity measurement system with an improved thermal behavior is provided. A turbidity measurement system includes an analyzer and one or more turbidity sensors. Each turbidity sensor includes a source of illumination and a semiconductor-based illumination sensor. The dark current of the semiconductor-based illumination sensor is measured when no illumination is provided by the source. This measured dark current is then used to provide a dark current-compensated turbidity measurement.
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