High throughput preparation and analysis of materials
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United States of America Patent
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Issued Date -
Aug 18, 2005
app pub date -
Apr 12, 2005
filing date -
Dec 7, 2001
priority date (Note) -
Abandoned
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Abstract
A rapid throughput method for the preparation, analysis or both of libraries of material samples is provided. According to the method, a plurality of samples is provided. Providing the plurality of samples can include a variety of sample formation techniques including, but not limited to, extruding, milling, compression preparation, rotary mixing, microcentrifugation, molding and casting. Preferably, the samples are solidified into a near net shape configuration appropriate for testing of properties or characteristics of the samples.
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