Algorithm for estimating and testing association between a haplotype and quantitative phenotype

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United States of America Patent

APP PUB NO 20050177316A1
SERIAL NO

10944821

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Abstract

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A method of estimating, in addition to haplotype frequencies and diplotype configurations, a means and a standard deviation determining a distribution of a quantitative phenotype by the diplotype on the basis of data on observed genotypes and phenotype data taking a continuous value. The method includes a step a of calculating the maximum likelihood (L.sub.0max) on the basis of genotype data and phenotype data taking a continuous value by using as parameters haplotype frequencies and a means and a standard deviation determining a distribution of a quantitative phenotype, under the hypothesis that there is no association between a diplotype configuration including a predetermined haplotype and a predetermined phenotype, and maximum likelihood estimates and the maximum likelihood (L.sub.max) of haplotype frequencies and penetration rate obtained by maximizing the likelihood under the hypothesis that there is an association between the diplotype configuration including the predetermined haplotype and the phenotype distribution taking a continuous value, and a step b of obtaining the means and the standard deviation determining a distribution of a quantitative phenotype from the maximum likelihood estimates obtained in the step a.

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Patent Owner(s)

Patent OwnerAddress
MITSUBISHI RESEARCH INSTITUTE INC2-10-3 NAGATACHO CHIYODA-KU TOKYO 1008141 ?1008141
STAGEN CO LTDKUGA BLDG 8F 4-11-6 KURAMAE TAITO-KU TOKYO 1110051

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ito, Toshikazu Tokyo, JP 46 433
Kamatani, Naoyuki Tokyo, JP 13 57
Kitamura, Yutaka Tokyo, JP 46 873

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