Scan pipelining for sensitivity improvement of orthogonal time-of-flight mass spectrometers
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Jun 23, 2005
app pub date -
Dec 17, 2004
filing date -
Dec 18, 2003
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
Methods and apparatus for analyzing ions by pipelining data acquisitions with an orthogonal time-of-flight (OTOF) mass spectrometer. A predetermined push sequence is established for launching packets of ions from a source region into a flight tube towards a detection region within the OTOF mass spectrometer such that ions which are launched in adjacent packets do not overlap prior to reaching the detection region. These discrete packets of ions do not intermingle and are launched in accordance with the predetermined push sequence along a propagation path from the source region toward the detection region such that portions of the packets of ions are simultaneously in-flight within the flight tube of the OTOF mass spectrometer. The times of arrival of ions are detected at the detection region to produce time-of-flight scans with signals corresponding to times of arrival for the ions in the launched packets of ions to provide a mass spectrum derived from pipelined data acquisitions.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully