Tandem time-of-flight mass spectrometer with delayed extraction and method for use
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
N/A
app pub date -
Aug 2, 2004
filing date -
Feb 6, 1998
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A tandem time-of-flight mass spectrometry including a pulsed ion generator, a timed ion selector in communication with the pulsed ion generator, an ion fragmentor in communication with the ion selector, and an analyzer in communication with the fragmentation chamber. The fragmentation chamber not only produces fragment ions, but also serves as a delayed extraction ion source for the analyzing of the fragment ions by time-of-flight mass spectrometry.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully