Method and arrangement for focusing in an optical measurement
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United States of America Patent
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Apr 17, 2007
Grant Date -
May 5, 2005
app pub date -
Aug 6, 2004
filing date -
Aug 8, 2003
priority date (Note) -
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Abstract
A method and arrangement for focus detection in an optical measuring apparatus. The invention is applicable to focus detection for measuring biological or chemical samples or for compiling an image. The position of a focus for an objective lens in a microscope can be measured more precisely than before. Another aim is to decrease scatter-inflicted interferences in the focusing of samples with a microscope and to reduce reflected light which disturbs focus detection. The aims are accomplished with an inventive solution, in which light reflecting from a measured object is occluded with a mask, positioned essentially in an image plane, and in which, at a suitable distance downstream of the mask, is a detector detecting the space distribution of light. According to a second aspect of the invention, the aims are achieved by a method and arrangement, wherein disturbing reflected light is eliminated by utilizing the polarization of light.
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