Etching method for semiconductor device

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United States of America Patent

APP PUB NO 20050037621A1
SERIAL NO

10917043

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Abstract

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An etching method for a semiconductor device comprising the steps of: generating an etching species atmosphere above the semiconductor device having a step composed of a main surface and a sidewall; and applying an electric field to accelerate the etching species in one direction and a magnetic field along a plane that crosses the one direction at a specific angle so that the sidewall is etched.

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Patent Owner(s)

Patent OwnerAddress
SHARP KABUSHIKI KAISHASAKAI-KU SAKAI CITY OSAKA 590-8522
FUJIO MASUOKA2-33-18 HIGASHIKATSUYAMA AOBA-KU SENDAI-SHI MIYAGI 981-0923

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Horii, Shinji Fukuyama-shi, JP 17 528
Masuoka, Fujio Sendai-shi, JP 412 6771
Tanigami, Takuji Fukuyama-shi, JP 26 616
Yokoyama, Takashi Fukuyama-shi, JP 220 2945

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