Apparatus and method for detecting thermoelectric properties of materials
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United States of America Patent
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Issued Date -
Feb 17, 2005
app pub date -
Aug 11, 2003
filing date -
Aug 11, 2003
priority date (Note) -
Abandoned
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Abstract
Apparatus and methods are provided for efficiently and non-destructively determining the thermal properties of materials having arbitrary surface textures. Two regions of a sample are each contacted by respective pairs of probes, where each pair includes a first probe made of a first material and a second probe made of a second material. A voltage sensor is arranged between the two probes of each pair, and between the probes of the same material from each pair. Nodes connect the voltage sensors to the probes. A temperature gradient is established between the two regions, while the nodes are maintained at a constant temperature. The Seebeck coefficient of the material and the temperatures of the regions can be determined from the voltages measured by the voltage sensors.
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