Method for thermal analysis and system for thermal analysis
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United States of America Patent
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Issued Date -
Jan 6, 2005
app pub date -
May 18, 2004
filing date -
Nov 19, 2001
priority date (Note) -
Abandoned
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Abstract
A temperature change is applied to at least a portion of a sample to be measured while measuring the thermal characteristic of a minute portion of the sample based on the temperature change by using infrared ray. There are provided a method and an apparatus which enable the thermal analysis of a minute portion of the sample.
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