cDNA microarray data correction system, method, program, and memory medium

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United States of America Patent

APP PUB NO 20040219566A1
SERIAL NO

10696572

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Abstract

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More precise correction of global and local distortions of microarray data and correction of measurement errors caused by a difference in sensitivity between fluorescent dyes. A data standardization unit for a first process inputs gene expression intensity data from an input device, standardizes the gene expression intensity data by using grid-by-grid order statistics on the assumption that most genes are in a non-expression state, and outputs the standardized gene expression intensity data. A spot-position-based correction unit for a second process estimates a distortion depending on a spot position on a grid by grid basis by a nonparametric smoothing method and outputs gene expression intensity data whose distortion depending on the spot position has been corrected. An S-D-plot-based correction unit for a third process performs an S-D transformation, estimates a distortion caused by a difference in sensitivity between the fluorescent dyes by the nonparametric smoothing method, and outputs the gene expression intensity data whose distortion caused by the difference in sensitivity between the fluorescent dyes has been corrected to the output device.

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Patent Owner(s)

Patent OwnerAddress
NEC CORPORATION108-8001 TOKYO
JAPAN BIOLOGICAL INFORMATICS CONSORTIUM4-32 AOMI 2-CHOME KOTO-KU TOKYO 135-8073
OHTAKI MEGU9-1-7 MIYAZONO HATSUKAICHI-SHI HIROSHIMA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Andoh, Masataka Tokyo, JP 4 5
Nishiyama, Masahiko Hiroshima, JP 17 63
Ohtaki, Megu Hiroshima, JP 3 3
Otani, Keiko Tokyo, JP 3 2
Saitoh, Akira Tokyo, JP 33 334
Satoh, Kenichi Hiroshima, JP 17 165

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