Runway overrun monitor and method for monitoring runway overruns

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20040167685A1
SERIAL NO

10442147

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A critical point on a runway indicates a point at which an aircraft may experience a runway overrun if landing beyond the critical point. A path projection is extended from the aircraft at a descent slope angle to determine whether the aircraft will land beyond the critical point at the current descent slope. Timely alerts may be provided by accounting for the time required to announce a distance value, and the distance traveled during the announcement.

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Patent Owner(s)

Patent OwnerAddress
AVIDYNE CORPORATION55 OLD BEDFORD ROAD LINCOLN MA 01773

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Brodegard, William C Delaware, OH 7 232
Ryan, Dean E Delaware, OH 18 361

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