Palsma etchingm method

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United States of America Patent

APP PUB NO 20040124176A1
SERIAL NO

10419796

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Abstract

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A plasma etching method for etching a substrate having a resin layer and an opening in an outer copper layer covering the resin layer is disclosed to include the step of contacting the outer surface of the copper layer with a chemical substance capable of making oxidation reaction with copper so as to form an oxide layer on the outer surface of the copper layer, and the step of employing a plasma etching technique of using a gas containing oxygen to form plasma to remove resin material from the resin layer corresponding to the opening of the copper layer.

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Patent Owner(s)

Patent OwnerAddress
ULTRATERA CORPORATIONNO 2 LI-HSIN RD 3 SCIENCE-BASED INDUSTRIAL PARK HSINCHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Li, Jen-Che Tauyuan Hsien, TW 1 1
Lin, Jung-Te Miaoli, TW 3 15

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