Correction for non-linearities in FTIR photo detectors

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United States of America Patent

APP PUB NO 20040118995A1
SERIAL NO

10626800

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method and for acquiring interferogram data and a Fourier transform spectrometer, including a detector that provides an output signal that exhibits non-linear distortion in a measured interferogram represented by a power series I.sub.m=a.sub.1I+a.sub.2I.sup.2+a.sub.3I.sup.3+ . . . , comprising the steps of representing a measured spectrum as S.sub.m=a.sub.1 S+a.sub.2(S*S)+a.sub.3 (S*S*S)+b.sub.3 (S*S*S*S)+ . . . where S is the spectrum of the linear interferogram and * indicates convolution, expressing a linear interferogram I as a power series of a measured interferogram I.sub.m as in I=b.sub.1I.sub.m+b.sub.2I.sub.m.sup.-2+b.sub.3I.sub.m.sup.3+ . . . , expressing the linear spectrum as a power series of the spectra of the interferogram powers S=b.sub.1S.sub.1+b.sub.-2S.sub.2+b.sub.3S.sub.3 . . . , and obtaining the coefficients b.sub.i where S=0.

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Patent Owner(s)

Patent OwnerAddress
VARIAN AUSTRALIA PTY LTD679 MULGRAVE VICTORIA 3170

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Curbelo, Raul Lexington, MA 18 217

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