High-frequency probe tip
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United States of America Patent
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N/A
Issued Date -
Apr 8, 2004
app pub date -
Nov 24, 2003
filing date -
Dec 21, 2000
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The invention relates to a high frequency probe tip, particularly for printed circuit boards and/or HF cables, having a connecting end (10) to which a measuring cable may be connected for linking to a measuring device, with an earth contact (16) and a measuring tip (12), on which at least one signal contact (14) is formed, whereby a coaxial conductor (18) with an earth conductor arrangement (20) and at least one signal conductor (22) surrounded by a dielectric (24) connects the connecting end (10) to the measuring tip (12). Starting from the measuring tip (12), the earth conductor arrangement (20) is so designed over a predetermined region (30) of the high frequency probe tip that at least one of the signal conductors (22) is displaceable within the earth conductor arrangement (20) together with the dielectric (24) surrounding said signal conductor.
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