Arrangement for determining the spectral reflectivity of a measurement object

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United States of America Patent

APP PUB NO 20040062350A1
SERIAL NO

10672110

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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In an arrangement for determining the spectral reflectivity of a measurement object, the object of the invention is to provide a simpler and more compact measuring arrangement, to eliminate the removal of elements from the beam path for detecting the reference beam, which was formally necessary, and to avoid complex translational and rotational movements. Different beam areas proceeding from the radiation source serve as measurement beam and reference beam which are directed simultaneously to different spectrally dispersing areas of at least one dispersive element and to different receiver areas of at least one receiver in a spectrograph. Preferred measurement objects are surfaces which reflect in a spectrally-dependent manner for radiation in the extreme ultraviolet range (EUV), but application of the arrangement is not limited to this spectral region.

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Patent Owner(s)

Patent OwnerAddress
JENOPTIK MIKROTECHNIK GMBHGOESCHWITZER STRASSE 40 D-07745 JENA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Missalla, Thomas Wismar, DE 5 28
Schuermann, Max Christian Luebbecke, DE 7 31
Seher, Bernd Jena, DE 5 18

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