Apparatus for spectral selection and detection of a light beam, and scanning microscope
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United States of America Patent
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Issued Date -
Feb 26, 2004
app pub date -
Aug 20, 2003
filing date -
Aug 21, 2002
priority date (Note) -
Abandoned
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Abstract
An apparatus for selection and detection of at least two spectral regions of a light beam is disclosed. The light beam is spectrally spread and focused into a focus line. The apparatus has means, modifiable in their position parallel to the focus line, for blocking out a first spectral region and for reflecting at least a portion of the unblocked spectral region and a detection device that encompasses means for detecting the first spectral region and means for detecting the reflected spectral region, whereby the detection device is arranged in a plane perpendicular to the focus line.
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