Photomask unit, photomask device, projection exposure device, projection exposure method and semiconductor device

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United States of America Patent

APP PUB NO 20040028269A1
SERIAL NO

10239657

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Abstract

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The atmosphere surrounding a photomask provided with a pellicle (2), particularly, an organic pellicle is replaced for purging with a mixed gas prepared by mixing an inert gas and a small amount of an active gas. The atmosphere in a space (8) between a mask base (1) and a pellicle (2) in a photomask is replaced for purging with a mixed gas prepared by mixing an inert gas and a small amount of an active gas.

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Patent Owner(s)

Patent OwnerAddress
MITSUI CHEMICALS INC2-1 YAESU 2-CHOME CHUO-KU TOKYO 1040028 ?1040028
SEMICONDUCTOR LEADING EDGE TECHNOLOGIES INCTSUKUBA-SHI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kozeki, Takashi Yamaguchi, JP 13 55
Miyazaki, Junji Hyogo, JP 45 420
Nakagawa, Hiroaki Yamaguchi, JP 96 388
Shigematsu, Shigeto Yamaguchi, JP 4 20
Yamabe, Osamu Tokyo, JP 2 17

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