Piezo-noise microscope and methods for use thereof
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United States of America Patent
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Issued Date -
Dec 25, 2003
app pub date -
Jul 31, 2002
filing date -
Jun 20, 2002
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Abandoned
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Abstract
A piezo-noise microscope for use in examining a sample of piezoelectric material is provided. The piezo-noise microscope improves on existing atomic force microscope (AFM) techniques by generating piezoresponse noise signals which are useful for determining the long-term polarization stability of piezoelectric materials, and in particular ferroelectric materials, without the need to make repeated observations over extended periods of time. A method for detecting piezo-response noise in a sample of piezoelectric material using a piezo-noise microscope, and a method for detecting the stability of polarization in regions of a sample of piezoelectric material, are also provided.
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