Method of and system for multiplexed analysis by spectral imaging

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United States of America Patent

APP PUB NO 20030215791A1
SERIAL NO

10277916

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Abstract

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A method of detecting the presence, absence and/or level of a plurality of analytes-of-interest in a sample, the method comprisES: (a) providing a plurality of objects, each of the plurality of objects having a predetermined, measurable and different imagery characteristic, and further having a predetermined and specific affinity to one analyte of the plurality of analytes-of-interest, each the imagery characteristic corresponding to one the predetermined specific affinity, hence each the imagery characteristic corresponds to one analyte of the plurality of analytes-of interest; (b) providing at least one affinity moiety having a predetermined and specific affinity or predetermined and specific affinities to the plurality of analytes-of-interest, each the affinity moiety having a predetermined, measurable response to light; (c) combining the objects, the at least one affinity moiety and the sample under conditions for affinity binding; and (d) simultaneously determining, for each object of the plurality of objects an imagery characteristic, and for at least a portion of the at least one affinity moiety a response to light, thereby detecting the presence, absence and/or level of the plurality of analytes-of-interest in the sample.

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Patent Owner(s)

Patent OwnerAddress
APPLIED SPECTRAL IMAGING LTD2 HACARMEL STREET P O BOX 262 YOKNEAM 2069204

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bar-Am, Irit Herzlia, IL 4 139
Cherepakhin, Vladimir Oceanside, CA 1 82
Garini, Yuval Doar Na Misgav, IL 22 1409
Hammill, Terry La Mesa, CA 1 82
Horn, Eli Kiryat Motzkin, IL 48 1954
Katzir, Nir Givat Elah, IL 11 895
Malinovich, Yacov Tivon, IL 17 714
Milman, Uri Migdal HaErnek, IL 4 106

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