Method for aligning a trapped microscopic particle along a selected axis and device operating accordingly

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United States of America Patent

APP PUB NO 20030179386A1
SERIAL NO

10096253

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A device for aligning a trapped microscopic particle along a selected axis of alignment, comprises a laser source emitting a laser beam, one or more mirrors to convey the laser beam into a trapping region of the microscopic particle, one or more astigmatic lenses capable to focus the laser beam in the trapping region. A trapped microscopic particle is aligned along a selected axis of alignment by: positioning the microscopic particle in a region where it can be illuminated by the laser beam, fixing the alignment axis of the microscopic particle, conveying the laser beam into the region of positioning of the microscopic particle, focussing the laser beam in the region of positioning of the microscopic particle so that the beam shows a cross section which is elongated along a chosen direction, the chosen direction being calculated as a function of the alignment axis of the microscopic particle.

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Patent Owner(s)

Patent OwnerAddress
INFM - ISTITUTO NAZIONALE PER LA FISICA DELLA MATERIACORSO F PERRONE 24 I-16152 GENOVA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Piccirillo, Bruno Napoli, IT 1 1
Santamato, Enrico Napoli, IT 2 4
Sasso, Antonio Napoli, IT 1 1

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