Apparatus and method for investigating a sample
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United States of America Patent
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Issued Date -
Aug 21, 2003
app pub date -
Mar 24, 2003
filing date -
Feb 28, 2000
priority date (Note) -
Abandoned
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Abstract
An apparatus and method for investigating a sample, the apparatus comprising: means (61) for irradiating the sample (21) with a first beam of electromagnetic radiation configured to excite an optically non-linear process within the sample; means (61) for irradiating the sample with a second beam of electromagnetic radiation; and a detector (41) for detecting a change the second beam after it has been reflected from or transmitted through the sample. If the optically non-linear process is a second order process, the detector could be used to detect a change in the polarisation of the second beam. Apparatus and method find application of samples with terahertz (THZ) radiation locally generated and detected within the sample.
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